Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress

Truong, Hai An and Lee, Hyeri and Kishii, Masahiro and Hong, Suk Whan and Lee, Hojoung (2020) Development and Characterization of Synthetic Hexaploid Wheat for Improving the Resistance of Common Wheat to Leaf Rust and Heat Stress. Agronomy, 11 (1). p. 18. ISSN 2073-4395

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Abstract

Synthetic hexaploid wheat (SHW) is a valuable resource for breeding because it possesses more desirable traits, such as better yield and abiotic and biotic stress tolerance than common wheat. In this study, our group developed a SHW line, named ‘SynDT’, which has markedly better characteristics than Korean bread wheat ‘Keumkang’. The SynDT line is thermotolerant as it rapidly expresses heat shock proteins under heat stress. In addition, this line exhibits resistance to leaf rust by inducing the expression of antifungal enzymes, mainly chitinase, along with the rapid and high expression of pathogen-related genes. Moreover, it possesses the favorable traits of its parent wheat lines Triticum durum #24 and Aegilops tauschii #52. Therefore, the SynDT wheat line can be used as a breeding material for improving local common wheat cultivars.

Item Type: Article
Subjects: Impact Archive > Agricultural and Food Science
Depositing User: Managing Editor
Date Deposited: 14 Feb 2023 06:24
Last Modified: 15 Mar 2024 12:11
URI: http://research.sdpublishers.net/id/eprint/1123

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